Advancements in EBSD Techniques: A Comprehensive Review on Characterization of Composites and Metals, Sample Preparation, and Operational Parameters

This comprehensive review focuses on the most recent advances in electron backscatter diffraction (EBSD) methods in the context of materials science and includes a thorough evaluation of the sample preparation procedures unique to EBSD as well as a complete examination of the important operational parameters inherent in EBSD setups. This review highlights the importance of customizing EBSD parameters for precise microstructural imaging and enhancing understanding of material behavior. While some studies have explored grain boundary characterization, stored energy, and crystallographic orientation using EBSD, there is a clear need for more comprehensive investigations to fully leverage its capabilities. Additionally, there is a significant gap in understanding the optimal choice of the reference plane in EBSD analysis, indicating the necessity for further research to improve EBSD analyses’ accuracy.