A Stady on the Nano Structural, Electrical Properties of Tin and Chromium Nitride Using X-Ray Diffraction Techniques

In this work, the structural, optical, and electrical properties of chromium nitride (Cr₂N) and tin (Sn) were investigated before and after mechanical grinding using X‑ray diffraction techniques. Chromium nitride powder was ground for 1 hour, while tin granules were first converted to filings, then ground for 2 hours to obtain powder. XRD analysis showed that Cr₂N retains a primitive hexagonal crystal structure and Sn a tetragonal I-centered structure, with a clear decrease in crystallite size after grinding (by 34.74 nm/mol for Cr₂N and 6.15 nm/mol for Sn). Optical transmittance and absorption spectra were recorded in the wavelength range 190–1100 nm, revealing decreased absorbance and increased transmittance after grinding for all samples. The optical band gap increased from 3.629 eV to 3.707 eV for Cr₂N and from 3.63 eV to 3.684 eV for Sn after grinding. Additionally, optical constants such as refractive index, extinction (damping) coefficient, real and imaginary parts of the dielectric constant, and optical conductivity were calculated, and a decrease in refractive index and related inertia parameters was observed after grinding.