SiliconinFe-SiAlloys: Correction ofX-RayIntensities forPreferred Orientation

This study investigates the texture effect in the silicon phase of industrial Fe-Si alloys as detected in the X-ray diffraction patterns, particularly noting the reinforcement of the 111 reflection. A similar texture effect was present in a commercial silicon standard pellet, which was assumed to be texture-free. The objective was to develop a quick correction procedure for addressing preferred orientation effects, which utilizes a previously established algorithm for the automatic profile fitting of powder diffractometer data. The methodology involved the creation of 'Modified Wilson plots' to visualize the efficiency of the proposed texture correction method. The results indicated that the presence of preferred orientation was confirmed and the correction approach significantly enhanced the accuracy of the X-ray intensity measurements. This work contributes valuable insights for researchers in mineralogy and materials science, particularly in the field of powder X-ray diffraction analysis and its application to ferrosilicon alloy studies.