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eversvd,+2 (16)

C. Akay, Z. Gültekin

2026ensource measure unitiv curvessemiconductorsdiodessolar cellsoledsourcemeterOLED productionmeasuring I-V curveselectronic componentsvoltage measurement

Abstract

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The voltage values used in an IV measurement often depend on the specific electronic components being tested. For example, to test a solar cell, voltage values in the range of -3 V to 3 V are sufficient, while for an LED this value extends from 0 V to 12 V. However, applying a voltage can alter the electronic properties of the system under test, such as changing the capacitive values of a diode. Thus, it is essential that the parameters of the tested system do not affect the current-voltage values during testing. This study presents a software-controlled current-voltage device designed and constructed to address these issues. We evaluated the performance of this system by measuring the turn-on voltage of an OLED device produced in our laboratory, thereby demonstrating its accuracy and effectiveness in obtaining reliable I-V measurements. The device's design and methodology were tailored to minimize the impact of the testing parameters on the system under evaluation, enhancing the precision of electronic measurements.

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Cite This Work

@article{e1f44c98-67ac-4baf-a686-888f3d406974,
  title={eversvd,+2 (16)},
  author={C. Akay and Z. Gültekin},
  year={2026},
  language={en}
}
TY  - JOUR
TI  - eversvd,+2 (16)
AU  - C. Akay
AU  - Z. Gültekin
PY  - 2026
LA  - en
ER  -

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