Eric Bauman, James DePoy
This paper assesses the accuracy of the added length method (also known as port extension or channel offset) for de-embedding coaxial-to-waveguide transitions in the X-band, comparing it to full waveguide calibration on both Keysight and Rohde & Schwarz VNAs. The study examines the trade-offs between cost and measurement accuracy, highlighting the feasibility of using these mathematical correction techniques in the absence of dedicated waveguide calibration kits or full S-parameter characterizations of the transitions. The analysis concluded that when using coaxial-to-waveguide transitions the added length method produces accurate results for transmission measurements only.
@article{eaf791de-11f0-49ca-aa64-e09d1c289b9e,
title={2026 Bauman XBand Adapter Deembedding},
author={Eric Bauman and James DePoy},
year={2026},
language={en}
}TY - JOUR TI - 2026 Bauman XBand Adapter Deembedding AU - Eric Bauman AU - James DePoy PY - 2026 LA - en ER -
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